SEAMS (Scanning Electron Analysis for Materials Science) is RJ Lee Group’s specialized software designed to enhance materials analysis through automated scanning electron microscopy (SEM). SEAMS streamlines the acquisition, processing, and interpretation of SEM data, providing advanced tools for microstructural analysis, defect identification, and surface characterization. With features like automated image stitching, data mapping, and elemental analysis integration, SEAMS empowers users to efficiently analyze complex materials with high precision and reproducibility. This software is ideal for researchers, engineers, and quality control professionals looking to optimize their SEM workflows and gain deeper insights into material properties.