IntelliSEM™ Automated Particle Analysis for Scanning Electron Microscopes (SEM) combines state-of-the-art SEM technology sourced from the industry's most respected manufacturers, with cutting-edge automation software from RJ Lee Group. Built by our scientists based on their experience in working with our customers to solve their most challenging problems, IntelliSEM offers automation, data review, and data interpretation in one package. The IntelliSEM experience encompasses SEM hardware, automation software, and continuous support from RJ Lee Group, sharing a wealth of knowledge, and assisting with any challenges that may arise. When you choose IntelliSEM, you're not just getting a product; you're gaining a partnership with a group of passionate experts committed to propelling your research or project to new heights.