The Cadence Modus DFT Software Solution revolutionizes design-for-test efficiency by reducing test times by up to 3X with its patented 2D Elastic Compression architecture, achieving compression ratios beyond 400X without impacting design size or routing. This comprehensive solution integrates seamlessly with Genus Synthesis and Innovus systems, offering features like memory BIST, logic BIST, advanced diagnostics, and test point insertion. With cutting-edge capabilities, including intelligent diagnostics, low-power test pattern generation, and high-accuracy defect detection, Modus ensures faster yield insights, superior silicon performance, and significant production cost savings. Simplify complex testing processes while maximizing coverage and maintaining superior PPA with Modus.